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Preliminary reliability at 50 V of State-of-the-art RF power GaN-on-Si HEMTs
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Preliminary reliability at 50 V of State-of-the-art RF power GaN-on-Si HEMTs
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Date
2010
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Medjdoub, Farid
;
Marcon, Denis
;
Das, Jo
;
Derluyn, Joff
;
Cheng, Kai
;
Degroote, Stefan
;
Germain, Marianne
;
Decoutere, Stefaan
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1905
since deposited on 2021-10-18
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Acq. date: 2025-12-10
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Metrics
Views
1905
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-10
Citations