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Towards automated security design flaw detection
Publication:
Towards automated security design flaw detection
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Date
2019
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sion, Laurens
;
Tuma, Katja
;
Scandariato, Riccardo
;
Yskout, Koen
;
Joosen, Wouter
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Abstract
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1972
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Acq. date: 2025-12-13
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Metrics
Views
1972
since deposited on 2021-10-27
2
last month
Acq. date: 2025-12-13
Citations