Publication:
Ron collapse, breakdown and degradation of d-mode MIS-HEMTs based on GaN on Si technology
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1960 since deposited on 2021-10-21
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Acq. date: 2026-07-16
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Statistics
Views
1960 since deposited on 2021-10-21
1last month
1last week
Acq. date: 2026-07-16
Citations