Publication:
Total ionizing dose damage in deep submicron partially depleted SOI MOSFETs induced by proton irradiation
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1885 since deposited on 2021-10-15
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Acq. date: 2026-10-12
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Views
1885 since deposited on 2021-10-15
1last month
1last week
Acq. date: 2026-10-12
Citations