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Towards Low Contact Resistance Metal Transition-Metal Dichalcogenide Contacts - A Quantum Transport Study

 
dc.contributor.authorBaikadi, Pranay
dc.contributor.authorKim, Raseong
dc.contributor.authorReyntjens, Peter
dc.contributor.authorPenumatcha, Ashish Verma
dc.contributor.authorVan de Put, Maarten
dc.contributor.authorVandenberghe, William G.
dc.contributor.imecauthorReyntjens, Peter
dc.contributor.imecauthorVan de Put, Maarten
dc.contributor.orcidimecVan de Put, Maarten::0000-0001-9179-6443
dc.date.accessioned2025-06-05T14:27:27Z
dc.date.available2025-02-23T23:40:20Z
dc.date.available2025-06-05T14:27:27Z
dc.date.issued2024
dc.description.wosFundingTextThis material is based upon work supported by Intel Corporation. We acknowledge the Texas Advanced Computing Center at The University of Texas at Austin for providing high performance computing resources.
dc.identifier.doi10.1109/SISPAD62626.2024.10732911
dc.identifier.eisbn979-8-3315-1635-2
dc.identifier.isbn979-8-3315-1636-9
dc.identifier.issnN/A
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45240
dc.publisherIEEE
dc.source.conferenceInternational Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
dc.source.conferencedateSEP 24-27, 2024
dc.source.conferencelocationSan Jose
dc.source.journalN/A
dc.source.numberofpages4
dc.title

Towards Low Contact Resistance Metal Transition-Metal Dichalcogenide Contacts - A Quantum Transport Study

dc.typeProceedings paper
dspace.entity.typePublication
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