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In-situ curvature and diffraction measurements on thin-film Ni/Ge(100) and Ni/Ge(111) solid state reactions
Publication:
In-situ curvature and diffraction measurements on thin-film Ni/Ge(100) and Ni/Ge(111) solid state reactions
Date
2007
Meeting abstract
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17647.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Opsomer, Karl
;
Deduytsche, D.
;
Detavernier, C.
;
Lavoie, C.
;
Lauwers, Anne
;
Van Meirhaeghe, R.L.
;
Maex, Karen
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1835
since deposited on 2021-10-16
Acq. date: 2025-10-25
Citations
Metrics
Views
1835
since deposited on 2021-10-16
Acq. date: 2025-10-25
Citations