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Study on Process Induced out-of-plane deformation for Fan-Out Wafer Level Packaging

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dc.contributor.authorSalahouelhadj, Abdellah
dc.contributor.authorGonzalez, Mario
dc.contributor.authorPodpod, Arnita
dc.contributor.authorBeyne, Eric
dc.contributor.imecauthorSalahouelhadj, A.
dc.contributor.imecauthorGonzalez, M.
dc.contributor.imecauthorPodpod, A.
dc.contributor.imecauthorBeyne, E.
dc.contributor.imecauthorSalahouelhadj, Abdellah
dc.contributor.imecauthorGonzalez, Mario
dc.contributor.imecauthorPodpod, Arnita
dc.contributor.imecauthorBeyne, Eric
dc.contributor.orcidimecSalahouelhadj, Abdellah::0000-0002-3795-1446
dc.contributor.orcidimecGonzalez, Mario::0000-0003-4374-4854
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.date.accessioned2021-12-08T10:50:11Z
dc.date.available2021-11-02T16:03:21Z
dc.date.available2021-12-08T10:50:11Z
dc.date.issued2020
dc.identifier.eisbn978-1-7281-6293-5
dc.identifier.issnna
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38045
dc.publisherIEEE
dc.source.conference8th IEEE Electronics System-Integration Technology Conference (ESTC)
dc.source.conferencedateSEP 15-18, 2020
dc.source.conferencelocationVestfold
dc.source.journalna
dc.source.numberofpages5
dc.subject.keywordsDENSITY
dc.title

Study on Process Induced out-of-plane deformation for Fan-Out Wafer Level Packaging

dc.typeProceedings paper
dspace.entity.typePublication
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