Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Towards cost-effective and low defectivity DSA flows for line/space patterning
Publication:
Towards cost-effective and low defectivity DSA flows for line/space patterning
Copy permalink
Date
2015
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pathangi Sriraman, Hari
;
Mallik, Arindam
;
Chan, BT
;
Vaid, Varun
;
Vandenbroeck, Nadia
;
Li, Jin
;
Hong, Sung Eun
;
Gronheid, Roel
Journal
Abstract
Description
Metrics
Views
1950
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations
Metrics
Views
1950
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations