Measuring thermal conductivity in a microfluidic device with the transient thermal offset (TTO) method

dc.contributor.author	Oudebrouckx, Gilles
dc.contributor.author	Vandenryt, Thys
dc.contributor.author	Bormans, Seppe
dc.contributor.author	Wagner, Patrick
dc.contributor.author	Thoelen, Ronald
dc.contributor.imecauthor	Oudebrouckx, Gilles
dc.contributor.imecauthor	Vandenryt, Thys
dc.contributor.imecauthor	Bormans, Seppe
dc.contributor.imecauthor	Thoelen, Ronald
dc.contributor.orcidimec	Thoelen, Ronald::0000-0001-6845-0866
dc.date.accessioned	2021-10-29T01:42:37Z
dc.date.available	2021-10-29T01:42:37Z
dc.date.embargo	9999-12-31
dc.date.issued	2020
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/35689
dc.identifier.url	https://ieeexplore.ieee.org/document/9278579
dc.source.conference	IEEE Sensors 2020
dc.source.conferencedate	25/10/2020
dc.source.conferencelocation	Rotterdam The Netherlands
dc.title	Measuring thermal conductivity in a microfluidic device with the transient thermal offset (TTO) method
dc.type	Proceedings paper
dspace.entity.type	Publication
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