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Impact of intermetallic formation and electro-migration on the integrity of bumped Cu/low-k Die
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Impact of intermetallic formation and electro-migration on the integrity of bumped Cu/low-k Die
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Date
2003
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Labie, Riet
;
Beyne, Eric
;
Degryse, Dominiek
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Abstract
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1976
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-10
Citations
Metrics
Views
1976
since deposited on 2021-10-15
1
last month
Acq. date: 2025-12-10
Citations