Publication:

A multi-bits/cell PUF using analog breakdown positions in CMOS

Date

2018
Proceedings Paper
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dc.contributor.authorChuang, Kent
dc.contributor.authorBury, Erik
dc.contributor.authorDegraeve, Robin
dc.contributor.authorKaczer, Ben
dc.contributor.authorKallstenius, Thomas
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorLinten, Dimitri
dc.contributor.authorVerbauwhede, Ingrid
dc.contributor.imecauthorChuang, Kent
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.accessioned2021-10-25T17:16:18Z
dc.date.available2021-10-25T17:16:18Z
dc.date.embargo9999-12-31
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30421
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8353655/
dc.source.beginpageP-CR.2-1
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate11/03/2018
dc.source.conferencelocationBurlingame, CA USA
dc.source.endpageP-CR.2-5
dc.title

A multi-bits/cell PUF using analog breakdown positions in CMOS

dc.typeProceedings paper
dspace.entity.typePublication
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