Publication:
Stress induced charge trapping effects in SiO2/Al2O3 gate stacks with TiN electrodes
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2029 since deposited on 2021-10-15
2last month
Acq. date: 2026-01-26
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Statistics
Views
2029 since deposited on 2021-10-15
2last month
Acq. date: 2026-01-26
Citations