Publication:
Low-frequency noise study of n-MOSFETs with HfO2 gate dielectric
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1946 since deposited on 2021-10-15
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Acq. date: 2026-03-16
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Statistics
Views
1946 since deposited on 2021-10-15
1last month
1last week
Acq. date: 2026-03-16
Citations