Publication:

Impact of MOSFET oxide breakdown on digital circuit operation and reliability

Date

2000
Proceedings Paper
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dc.contributor.authorKaczer, Ben
dc.contributor.authorDegraeve, Robin
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorRasras, Mahmoud
dc.contributor.authorKubicek, Stefan
dc.contributor.authorVandamme, Ewout
dc.contributor.authorBadenes, Gonçal
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorKubicek, Stefan
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-14T13:07:50Z
dc.date.available2021-10-14T13:07:50Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4462
dc.source.beginpage553
dc.source.conferenceIEDM Technical Digest
dc.source.conferencedate10/12/2000
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage556
dc.title

Impact of MOSFET oxide breakdown on digital circuit operation and reliability

dc.typeProceedings paper
dspace.entity.typePublication
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