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Removal of small (<100-nm) particles and metal contamination in single-wafer cleaning tool
Publication:
Removal of small (<100-nm) particles and metal contamination in single-wafer cleaning tool
Date
2003
Proceedings Paper
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7811.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Eitoku, Atsuro
;
Snow, Jim
;
Vos, Rita
;
Sato, M.
;
Hirae, S.
;
Nakajima, K.
;
Nonomura, M.
;
Imai, M.
;
Mertens, Paul
;
Heyns, Marc
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2061
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
2061
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations