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Conference contributions
Linewidth and roughness measurement of SAOP by using FIB and planer-TEM as reference metrology
Publication:
Linewidth and roughness measurement of SAOP by using FIB and planer-TEM as reference metrology
Date
2019
Proceedings Paper
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44031.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Takamasu, Kiyoshi
;
Takahashi, Satoru
;
Kawada, Hiroki
;
Ikota, Masami
;
Decoster, Stefan
;
Lazzarino, Frederic
;
Lorusso, Gian
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1899
since deposited on 2021-10-27
Acq. date: 2025-10-23
Citations
Metrics
Views
1899
since deposited on 2021-10-27
Acq. date: 2025-10-23
Citations