Energy and Side-channel Security Evaluation of Near-threshold Cryptographic Circuits in 28nm FD-SOI Technology

Beckers, Arthur; Uytterhoeven, Roel; Vandenabeele, Thomas; Vliegen, Jo; Wouters, Lennert; Daemen, Joan; Dehaene, Wim; Gierlichs, Benedikt; Mentens, Nele

doi:10.1145/3528416.3530992

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Energy and Side-channel Security Evaluation of Near-threshold Cryptographic Circuits in 28nm FD-SOI Technology

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2022

Proceedings Paper

https://doi.org/10.1145/3528416.3530992

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369 since deposited on 2023-03-10

Acq. date: 2026-07-08

1240 since deposited on 2023-03-10

Acq. date: 2026-07-08

Energy and Side-channel Security Evaluation of Near-threshold Cryptographic Circuits in 28nm FD-SOI Technology

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