Publication:

Multi-beam microscopy free of sample-induced phase distortions

Date

2018
Proceedings Paper
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dc.contributor.authorDiaz Tormo, Alejandro
dc.contributor.authorKhalenkow, Dmitry
dc.contributor.authorSkirtach, Abdre G.
dc.contributor.authorLe Thomas, Nicolas
dc.contributor.imecauthorDiaz Tormo, Alejandro
dc.contributor.imecauthorLe Thomas, Nicolas
dc.date.accessioned2021-10-25T18:15:44Z
dc.date.available2021-10-25T18:15:44Z
dc.date.embargo9999-12-31
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30637
dc.identifier.urlhttps://www.photonics.intec.ugent.be/download/pub_4297.pdf
dc.source.beginpage1
dc.source.conference23rd Annual Symposium of the IEEE Photonics Benelux Chapter
dc.source.conferencedate15/11/2018
dc.source.conferencelocationBrussels Belgium
dc.source.endpage4
dc.title

Multi-beam microscopy free of sample-induced phase distortions

dc.typeProceedings paper
dspace.entity.typePublication
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