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Zn channeled implantation in GaN: damages investigated by using high resolution XTEM and channeling RBS
Publication:
Zn channeled implantation in GaN: damages investigated by using high resolution XTEM and channeling RBS
Date
2003
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ding, F.R.
;
He, W.
;
Vantomme, Andre
;
Zhao, Q.
;
Pipeleers, B.
;
Jacobs, K.
;
Moerman, Ingrid
Journal
Materials Science and Engineering B
Abstract
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1984
since deposited on 2021-10-15
Acq. date: 2025-12-08
Citations
Metrics
Views
1984
since deposited on 2021-10-15
Acq. date: 2025-12-08
Citations