Publication:
Analysing impact of MOSFET oxide breakdown by small- and large-signal HF measurements
Date
| dc.contributor.author | Schreurs, Dominique | |
| dc.contributor.author | Pantisano, Luigi | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.imecauthor | Schreurs, Dominique | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2021-10-15T16:07:05Z | |
| dc.date.available | 2021-10-15T16:07:05Z | |
| dc.date.issued | 2004 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9572 | |
| dc.source.beginpage | 85 | |
| dc.source.conference | Automatic RF Techniques Group Conference (ARFTG) | |
| dc.source.conferencedate | 30/11/2004 | |
| dc.source.conferencelocation | Orlando, FL USA | |
| dc.source.endpage | 91 | |
| dc.title | Analysing impact of MOSFET oxide breakdown by small- and large-signal HF measurements | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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