Publication:

Physical characterization and reliability aspects of MuGFETs

Date

2007
Proceedings Paper
Simple item page Full metadata Statistics
Loading...
Thumbnail Image

Files

14905.pdf 405.22 KB

Author(s)

Claeys, Cor
;
Simoen, Eddy  
;
Rafi, J.M.
;
Pavanello, M.A.
;
Martino, J.A.

Journal

Abstract

Description

Statistics

Views

1811 since deposited on 2021-10-16
Acq. date: 2026-08-25

Citations

Statistics

Views

1811 since deposited on 2021-10-16
Acq. date: 2026-08-25

Citations