The influence of the package environment on the functioning and reliability of capacitive RF-MEMS switches

dc.contributor.author	De Wolf, Ingrid
dc.contributor.author	Czarnecki, Piotr
dc.contributor.author	Jourdain, Anne
dc.contributor.author	Modlinski, Robert
dc.contributor.author	Tilmans, Harrie
dc.contributor.author	Puers, Bob
dc.contributor.author	van Beek, Joost
dc.contributor.author	van Spengen, Merlijn
dc.contributor.imecauthor	De Wolf, Ingrid
dc.contributor.imecauthor	Czarnecki, Piotr
dc.contributor.imecauthor	Jourdain, Anne
dc.contributor.imecauthor	Tilmans, Harrie
dc.contributor.imecauthor	Puers, Bob
dc.contributor.orcidimec	De Wolf, Ingrid::0000-0003-3822-5953
dc.contributor.orcidimec	Tilmans, Harrie::0000-0003-4240-4962
dc.date.accessioned	2021-10-16T01:14:05Z
dc.date.available	2021-10-16T01:14:05Z
dc.date.issued	2005
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/10338
dc.source.beginpage	102
dc.source.endpage	116
dc.source.issue	12
dc.source.journal	Microwave Journal
dc.source.volume	48
dc.title	The influence of the package environment on the functioning and reliability of capacitive RF-MEMS switches
dc.type	Journal article
dspace.entity.type	Publication
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