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Impact of in-situ annealing on the deep levels in Ni-Au/AlN/Si MIS Capacitors
Publication:
Impact of in-situ annealing on the deep levels in Ni-Au/AlN/Si MIS Capacitors
Date
2019
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wang, Chong
;
Li, W.
;
Zhao, Ming
;
Simoen, Eddy
Journal
Physica Status Solidi A
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1900
since deposited on 2021-10-27
Acq. date: 2025-10-25
Citations
Metrics
Views
1900
since deposited on 2021-10-27
Acq. date: 2025-10-25
Citations