Publication:

Impact of Seed Annealing on the Reliability of Monolithic GaAs/Si p-n Diode Optical Phase Shifters

Date

2022
Proceedings Paper
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dc.contributor.authorTsiara, Artemisia
dc.contributor.authorKim, Younghyun
dc.contributor.authorYudistira, Didit
dc.contributor.authorKunert, Bernardette
dc.contributor.authorBaryshnikova, Marina
dc.contributor.authorPantouvaki, Marianna
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorCroes, Kristof
dc.contributor.imecauthorTsiara, Artemisia
dc.contributor.imecauthorKim, Younghyun
dc.contributor.imecauthorYudistira, Didit
dc.contributor.imecauthorKunert, Bemardette
dc.contributor.imecauthorBaryshnikova, Marina
dc.contributor.imecauthorPantouvaki, Marianna
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorCroes, Kristof
dc.contributor.orcidimecTsiara, Artemisia::0000-0002-5612-6468
dc.contributor.orcidimecBaryshnikova, Marina::0000-0002-5945-4459
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.contributor.orcidimecYudistira, Didit::0000-0003-1440-5407
dc.date.accessioned2023-05-25T10:00:19Z
dc.date.available2023-03-26T03:50:03Z
dc.date.available2023-05-25T10:00:19Z
dc.date.embargo2022-09-22
dc.date.issued2022
dc.description.wosFundingTextThis work was supported by imec's industrial affiliation R&D program on Optical I/O. In particular, the members of the MCA group are acknowledged for FIB specimen preparation and TEM analysis.
dc.identifier.eisbn978-1-957171-15-9
dc.identifier.issnna
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41378
dc.publisherIEEE
dc.source.conferenceEuropean Conference on Optical Communication (ECOC)
dc.source.conferencedateSEP 18-22, 2022
dc.source.conferencelocationBasel
dc.source.journalna
dc.source.numberofpages4
dc.title

Impact of Seed Annealing on the Reliability of Monolithic GaAs/Si p-n Diode Optical Phase Shifters

dc.typeProceedings paper
dspace.entity.typePublication
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