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Degradation and nitridation dependence of steady-state stress induced leakage current (SILC)
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Degradation and nitridation dependence of steady-state stress induced leakage current (SILC)
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Date
1996
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Blauwe, Jan
;
Degraeve, Robin
;
Bellens, Rudi
;
Van Houdt, Jan
;
Groeseneken, Guido
;
Maes, Herman
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2015
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Views
2015
since deposited on 2021-09-29
4
last month
4
last week
Acq. date: 2026-01-25
Citations