Publication:
Developments in the structural characterisation of silicides
Date
| dc.contributor.author | Bender, Hugo | |
| dc.contributor.imecauthor | Bender, Hugo | |
| dc.date.accessioned | 2021-10-15T04:00:34Z | |
| dc.date.available | 2021-10-15T04:00:34Z | |
| dc.date.issued | 2003 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7193 | |
| dc.source.conference | International Conference on Microscopy of Semiconductor Materials (MSM XIII) | |
| dc.source.conferencedate | 31/03/2003 | |
| dc.source.conferencelocation | Cambridge England | |
| dc.title | Developments in the structural characterisation of silicides | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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