Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations
Publication:
Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations
Copy permalink
Date
2012
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Nazir, Aftab
;
Eyben, Pierre
;
Clarysse, Trudo
;
Hellings, Geert
;
Schulze, Andreas
;
Mody, Jay
;
De Meyer, Kristin
;
Bender, Hugo
;
Vandervorst, Wilfried
Journal
Solid-State Electronics
Abstract
Description
Metrics
Views
1892
since deposited on 2021-10-20
1
last month
Acq. date: 2025-12-15
Citations
Metrics
Views
1892
since deposited on 2021-10-20
1
last month
Acq. date: 2025-12-15
Citations