Publication:

Statistical characterization of BTI and RTN using pMOS arrays

Date

2019
Proceedings Paper
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dc.contributor.authorStampfer, Bernhard
dc.contributor.authorSimicic, Marko
dc.contributor.authorWeckx, Pieter
dc.contributor.authorAbbasi, Arash
dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, Tibor
dc.contributor.authorWaltl, Michael
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-27T19:01:57Z
dc.date.available2021-10-27T19:01:57Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34068
dc.source.conferenceIEEE International Integrated Reliability Workshop (IIRW)
dc.source.conferencedate13/10/2019
dc.source.conferencelocationFallen Leaf Lake, CA USa
dc.title

Statistical characterization of BTI and RTN using pMOS arrays

dc.typeProceedings paper
dspace.entity.typePublication
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