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Study of dielectric breakdown on 4.3 nm oxides using substrate hot electron injection

Date

1997
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dc.contributor.authorNigam, Tanya
dc.contributor.authorDegraeve, Robin
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorHeyns, Marc
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorHeyns, Marc
dc.date.accessioned2021-09-30T09:20:49Z
dc.date.available2021-09-30T09:20:49Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2055
dc.source.conferenceSISC-Conference; December 1997; Charleston, South-Carolina, USA.
dc.source.conferencelocation
dc.title

Study of dielectric breakdown on 4.3 nm oxides using substrate hot electron injection

dc.typeOral presentation
dspace.entity.typePublication
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