Publication:
p-n Junction leeakage in neutron-irradiated diodes fabricated in various silicon substrates
Date
| dc.contributor.author | Czerwinski, A. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Poyai, Amporn | |
| dc.contributor.author | Claeys, C. | |
| dc.contributor.author | Ohyama, Hidenori | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-14T21:19:11Z | |
| dc.date.available | 2021-10-14T21:19:11Z | |
| dc.date.issued | 2002 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/6165 | |
| dc.source.beginpage | 447 | |
| dc.source.conference | GADEST 2001 - Proceedings of the 9th International Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology | |
| dc.source.conferencedate | 30/09/2001 | |
| dc.source.conferencelocation | Catania Italy | |
| dc.source.endpage | 452 | |
| dc.title | p-n Junction leeakage in neutron-irradiated diodes fabricated in various silicon substrates | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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