Publication:

Negative bias temperature instabilities in HfSiON/TaN-based pMOSFETs

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1849 since deposited on 2021-10-15
2last month
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Acq. date: 2025-12-16

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1849 since deposited on 2021-10-15
2last month
1last week
Acq. date: 2025-12-16

Citations