Publication:

Degradation mapping of IGZO TFTs

Date

2022
Proceedings Paper
https://doi.org/10.1109/IIRW56459.2022.10032766
Simple item page Full metadata Statistics
 
dc.contributor.authorRinaudo, P.
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorFranco, Jacopo
dc.contributor.authorWu, Zhicheng
dc.contributor.authorRassoul, Nouredine
dc.contributor.authorDelhougne, Romain
dc.contributor.authorKaczer, Ben
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorKar, Gouri Sankar
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorWu, Zhicheng
dc.contributor.imecauthorRassoul, Nouredine
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRassoul, Nouredine::0000-0001-9489-3396
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.date.accessioned2023-06-01T12:32:09Z
dc.date.available2023-05-26T19:52:18Z
dc.date.available2023-06-01T12:32:09Z
dc.date.issued2022
dc.identifier.doi10.1109/IIRW56459.2022.10032766
dc.identifier.eisbn978-1-6654-5368-4
dc.identifier.issn1930-8841
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41647
dc.publisherIEEE
dc.source.conferenceIEEE International Integrated Reliability Workshop (IIRW)
dc.source.conferencedateOCT 09-14, 2022
dc.source.conferencelocationSouth Lake Tahoe
dc.source.journalna
dc.source.numberofpages5
dc.subject.keywordsRELAXATION
dc.title

Degradation mapping of IGZO TFTs

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions