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System exploration and technology demonstration of 3D Wafer-to-Wafer integrated STT-MRAM based caches for advanced Mobile SoCs

 
dc.contributor.authorPerumkunnil, Manu
dc.contributor.authorYasin, Farrukh
dc.contributor.authorRao, Siddharth
dc.contributor.authorSalahuddin, Shairfe Muhammad
dc.contributor.authorMilojevic, Dragomir
dc.contributor.authorVan der Plas, Geert
dc.contributor.authorRyckaert, Julien
dc.contributor.authorBeyne, Eric
dc.contributor.authorFurnemont, Arnaud
dc.contributor.authorKar, Gouri Sankar
dc.contributor.imecauthorPerumkunnil, M.
dc.contributor.imecauthorYasin, F.
dc.contributor.imecauthorRao, S.
dc.contributor.imecauthorSalahuddin, S. M.
dc.contributor.imecauthorMilojevic, D.
dc.contributor.imecauthorVan der Plas, G.
dc.contributor.imecauthorRyckaert, J.
dc.contributor.imecauthorBeyne, Eric
dc.contributor.imecauthorFurnemont, A.
dc.contributor.imecauthorKar, G. S.
dc.contributor.imecauthorPerumkunnil, Manu
dc.contributor.imecauthorYasin, Farrukh
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorSalahuddin, Shairfe Muhammad
dc.contributor.imecauthorMilojevic, Dragomir
dc.contributor.imecauthorVan der Plas, Geert
dc.contributor.imecauthorRyckaert, Julien
dc.contributor.imecauthorFurnemont, Arnaud
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.contributor.orcidimecYasin, Farrukh::0000-0002-7295-0254
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecSalahuddin, Shairfe Muhammad::0000-0002-6483-8430
dc.contributor.orcidimecVan der Plas, Geert::0000-0002-4975-6672
dc.contributor.orcidimecFurnemont, Arnaud::0000-0002-6378-1030
dc.date.accessioned2022-01-24T10:55:39Z
dc.date.available2021-12-06T02:06:17Z
dc.date.available2022-01-24T10:55:39Z
dc.date.issued2020
dc.identifier.doi10.1109/IEDM13553.2020.9372046
dc.identifier.eisbn978-1-7281-8888-1
dc.identifier.issn2380-9248
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38540
dc.publisherIEEE
dc.source.conferenceIEEE International Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 12-18, 2020
dc.source.conferencelocationVirtual
dc.source.journalna
dc.source.numberofpages4
dc.title

System exploration and technology demonstration of 3D Wafer-to-Wafer integrated STT-MRAM based caches for advanced Mobile SoCs

dc.typeProceedings paper
dspace.entity.typePublication
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