Publication:
Random telegraph signals as a diagnostic tool to study single defects in submicron silicon MOSFETs
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1999 since deposited on 2021-10-14
2last month
Acq. date: 2026-04-05
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Statistics
Views
1999 since deposited on 2021-10-14
2last month
Acq. date: 2026-04-05
Citations