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Evaluation of non-linear modelling techniques for MOSFETs based on vectorial large-signal measurements

Date

2000
Proceedings Paper
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dc.contributor.authorSchreurs, Dominique
dc.contributor.authorVandenberghe, S.
dc.contributor.authorCarchon, Geert
dc.contributor.authorNauwelaers, Bart
dc.contributor.authorVandamme, Ewout
dc.contributor.authorBadenes, Gonçal
dc.contributor.authorDeferm, Ludo
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.imecauthorDeferm, Ludo
dc.date.accessioned2021-10-14T13:45:16Z
dc.date.available2021-10-14T13:45:16Z
dc.date.embargo9999-12-31
dc.date.issued2000
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/4735
dc.source.beginpage429
dc.source.conferenceIEEE International Symposium on Circuits and Systems - ISCAS
dc.source.conferencedate28/05/2000
dc.source.conferencelocationGeneva Switzerland
dc.source.endpage432
dc.title

Evaluation of non-linear modelling techniques for MOSFETs based on vectorial large-signal measurements

dc.typeProceedings paper
dspace.entity.typePublication
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