Publication:

Probing the intrinsic limitations of the contact resistance of metal/semiconductor interfaces through atomistic simulations

Date

2017
Proceedings Paper
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dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorDabral, Ashish
dc.contributor.authorSankaran, Kiroubanand
dc.contributor.authorMagnus, Wim
dc.contributor.authorYu, Hao
dc.contributor.authorde Jamblinne de Meux, Albert
dc.contributor.authorLu, Augustin
dc.contributor.authorClima, Sergiu
dc.contributor.authorStokbro, Kurt
dc.contributor.authorSchaekers, Marc
dc.contributor.authorHoussa, Michel
dc.contributor.authorCollaert, Nadine
dc.contributor.authorHoriguchi, Naoto
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorDabral, Ashish
dc.contributor.imecauthorSankaran, Kiroubanand
dc.contributor.imecauthorMagnus, Wim
dc.contributor.imecauthorYu, Hao
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorSchaekers, Marc
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecSankaran, Kiroubanand::0000-0001-6988-7269
dc.contributor.orcidimecYu, Hao::0000-0002-1976-0259
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecSchaekers, Marc::0000-0002-1496-7816
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.date.accessioned2021-10-24T11:20:31Z
dc.date.available2021-10-24T11:20:31Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29210
dc.identifier.urlhttp://ecst.ecsdl.org/content/80/1/303.abstract
dc.source.beginpage303
dc.source.conferenceSemiconductors, Dielectrics, and Metals for Nanoelectronics 15: In Memory of Samares Kar
dc.source.conferencedate1/10/2017
dc.source.conferencelocationNational Harbor, MD USA
dc.source.endpage311
dc.title

Probing the intrinsic limitations of the contact resistance of metal/semiconductor interfaces through atomistic simulations

dc.typeProceedings paper
dspace.entity.typePublication
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