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Modeling the Operation of Charge Trap Flash Memory: A Monte Carlo Approach to Carrier Distribution and (De)trapping

 
dc.contributor.authorHellemans, Thomas
dc.contributor.authorVerreck, Devin
dc.contributor.authorArreghini, Antonio
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorRosmeulen, Maarten
dc.contributor.authorHoussa, Michel
dc.contributor.authorVan Houdt, Jan
dc.contributor.imecauthorHellemans, Thomas
dc.contributor.imecauthorVerreck, Devin
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorRosmeulen, Maarten
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.imecauthorHoussa, Michel
dc.contributor.orcidimecHellemans, Thomas::0000-0001-9870-7108
dc.contributor.orcidimecVerreck, Devin::0000-0002-3833-5880
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecRosmeulen, Maarten::0000-0002-3663-7439
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.date.accessioned2025-04-10T13:32:35Z
dc.date.available2025-02-23T23:40:19Z
dc.date.available2025-04-10T13:32:35Z
dc.date.issued2024
dc.description.wosFundingTextThis work was supported by imec's Industrial Affiliation Program for storage memories.
dc.identifier.doi10.1109/SISPAD62626.2024.10733042
dc.identifier.eisbn979-8-3315-1635-2
dc.identifier.isbn979-8-3315-1636-9
dc.identifier.issnN/A
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45239
dc.publisherIEEE
dc.source.conferenceInternational Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
dc.source.conferencedateSEP 24-27, 2024
dc.source.conferencelocationSan Jose
dc.source.journalN/A
dc.source.numberofpages4
dc.title

Modeling the Operation of Charge Trap Flash Memory: A Monte Carlo Approach to Carrier Distribution and (De)trapping

dc.typeProceedings paper
dspace.entity.typePublication
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