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Assessment of Electromigration in Nano-Interconnects
Publication:
Assessment of Electromigration in Nano-Interconnects
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Date
2019
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ceric, Hajdin
;
Selberherr, Siegfried
;
Zahedmanesh, Houman
;
de Orio, Roberto
;
Croes, Kristof
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Downloads
1
since deposited on 2021-10-27
Acq. date: 2026-01-10
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1923
since deposited on 2021-10-27
3
last month
Acq. date: 2026-01-10
Citations