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Unbiased roughness measurements: subtracting out SEM effects
Publication:
Unbiased roughness measurements: subtracting out SEM effects
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Date
2017
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lorusso, Gian
;
Rutigliani, Vito
;
Van Roey, Frieda
;
Mack, Chris
Journal
Abstract
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1988
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Acq. date: 2025-12-10
Citations
Metrics
Views
1988
since deposited on 2021-10-24
4
last month
2
last week
Acq. date: 2025-12-10
Citations