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Comparison between existing inspection techniques for EUV mask defects
Publication:
Comparison between existing inspection techniques for EUV mask defects
Date
2010
Proceedings Paper
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20883.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Den Heuvel, Dieter
;
Jonckheere, Rik
;
Hendrickx, Eric
;
Cheng, Shaunee
;
Ronse, Kurt
;
Abe, Tsukasa
;
Magana, John
;
Bret, Tristan
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1918
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations
Metrics
Views
1918
since deposited on 2021-10-18
Acq. date: 2025-10-23
Citations