Sense amplifier offset voltage analysis for both time-zero and time-dependent variability

dc.contributor.author	Agbo, Innocent
dc.contributor.author	Taouil, Motta
dc.contributor.author	Kraak, Daniel
dc.contributor.author	Hamdioui, Said
dc.contributor.author	Weckx, Pieter
dc.contributor.author	Cosemans, Stefan
dc.contributor.author	Raghavan, Praveen
dc.contributor.author	Catthoor, Francky
dc.contributor.author	Dehaene, Wim
dc.contributor.imecauthor	Weckx, Pieter
dc.contributor.imecauthor	Cosemans, Stefan
dc.contributor.imecauthor	Catthoor, Francky
dc.contributor.imecauthor	Dehaene, Wim
dc.contributor.orcidimec	Catthoor, Francky::0000-0002-3599-8515
dc.date.accessioned	2021-10-27T07:25:13Z
dc.date.available	2021-10-27T07:25:13Z
dc.date.issued	2019
dc.identifier.issn	0026-2714
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/32409
dc.identifier.url	https://doi.org/10.1016/j.microrel.2019.03.009
dc.source.beginpage	52
dc.source.endpage	61
dc.source.journal	Microelectronics Reliability
dc.source.volume	99
dc.title	Sense amplifier offset voltage analysis for both time-zero and time-dependent variability
dc.type	Journal article
dspace.entity.type	Publication
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