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Intra-wafer CD-control in state-of-the-art lithography
Publication:
Intra-wafer CD-control in state-of-the-art lithography
Date
1999
Proceedings Paper
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3723.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pollentier, Ivan
;
Baerts, Christina
;
Marschner, Thomas
;
Ronse, Kurt
;
Grozev, Grozdan
;
Reybrouck, Mario
Journal
Abstract
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1996
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1996
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations