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A general line-line method for dielectric material characterization using conductors with the same cross-sectional geometry

Date

2018
Journal article
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dc.contributor.authorBao, Xiue
dc.contributor.authorLiu, Song
dc.contributor.authorOcket, Ilja
dc.contributor.authorBao, Juncheng
dc.contributor.authorSchreurs, Dominique
dc.contributor.authorZhang, Shengkang
dc.contributor.authorCheng, Chunyue
dc.contributor.authorFeng, Keming
dc.contributor.authorNauwelaers, Bart
dc.contributor.imecauthorOcket, Ilja
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorNauwelaers, Bart
dc.contributor.orcidimecOcket, Ilja::0000-0002-1503-7397
dc.date.accessioned2021-10-25T16:38:45Z
dc.date.available2021-10-25T16:38:45Z
dc.date.embargo9999-12-31
dc.date.issued2018
dc.identifier.issn1531-1309
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30197
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8310028/
dc.source.beginpage356
dc.source.endpage358
dc.source.issue4
dc.source.journalIEEE Microwave and Wireless Components Letters
dc.source.volume28
dc.title

A general line-line method for dielectric material characterization using conductors with the same cross-sectional geometry

dc.typeJournal article
dspace.entity.typePublication
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