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Accelerated device degradation analysis on high speed Ge waveguide photodetectors
Publication:
Accelerated device degradation analysis on high speed Ge waveguide photodetectors
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Date
2019
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lesniewska, Alicja
;
Srinivasan, Ashwyn
;
Van Campenhout, Joris
;
O'Sullivan, Barry
;
Croes, Kristof
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Abstract
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1976
since deposited on 2021-10-27
Acq. date: 2025-12-16
Citations
Metrics
Views
1976
since deposited on 2021-10-27
Acq. date: 2025-12-16
Citations