Publication:

Transient overshoot of sub-10nm bulk FinFET ESD diodes with S/D epitaxy stressor

Date

2019
Proceedings Paper
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Author(s)

Chen, Shih-Hung  
;
Linten, Dimitri  
;
Hellings, Geert  
;
Simicic, Marko  
;
Chiarella, Thomas  
;
Eyben, Pierre  
;
Kubicek, Stefan  
;
Rosseel, Erik  
;
Hikavyy, Andriy  
;
Horiguchi, Naoto  

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