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Transient overshoot of sub-10nm bulk FinFET ESD diodes with S/D epitaxy stressor
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Transient overshoot of sub-10nm bulk FinFET ESD diodes with S/D epitaxy stressor
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Date
2019
Proceedings Paper
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41086.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chen, Shih-Hung
;
Linten, Dimitri
;
Hellings, Geert
;
Simicic, Marko
;
Chiarella, Thomas
;
Eyben, Pierre
;
Kubicek, Stefan
;
Rosseel, Erik
;
Hikavyy, Andriy
;
Horiguchi, Naoto
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since deposited on 2021-10-27
Acq. date: 2026-01-09
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1900
since deposited on 2021-10-27
2
last month
1
last week
Acq. date: 2026-01-09
Citations
Metrics
Downloads
1
since deposited on 2021-10-27
Acq. date: 2026-01-09
Views
1900
since deposited on 2021-10-27
2
last month
1
last week
Acq. date: 2026-01-09
Citations