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Analysis of dopant diffusion and defects in SiGe-channel implant free quantum well (IFQW) devices using an atomistic kinetic Monte Carlo approach
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1943 since deposited on 2021-10-20
1last month
Acq. date: 2025-12-10
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Metrics
Views
1943 since deposited on 2021-10-20
1last month
Acq. date: 2025-12-10
Citations