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1/f low frequency fluctuations and inversion layer quantization in deep submicron metal-oxide-semiconductor field effect transistors

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dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-14T22:22:43Z
dc.date.available2021-10-14T22:22:43Z
dc.date.issued2002
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/6595
dc.source.beginpageCM1-12
dc.source.conferenceBelgische Natuurkundige Vereniging / Société Belge de Physique: General Scientific Meeting
dc.source.conferencedate5/06/2002
dc.source.conferencelocationLiège Belgium
dc.title

1/f low frequency fluctuations and inversion layer quantization in deep submicron metal-oxide-semiconductor field effect transistors

dc.typeMeeting abstract
dspace.entity.typePublication
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