Publication:
What can low-frequency noise teach us about the quality of thin-gate dielectrics?
Date
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Mercha, Abdelkarim | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.imecauthor | Mercha, Abdelkarim | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.contributor.orcidimec | Mercha, Abdelkarim::0000-0002-2174-6958 | |
| dc.date.accessioned | 2021-10-15T06:40:34Z | |
| dc.date.available | 2021-10-15T06:40:34Z | |
| dc.date.issued | 2003 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8145 | |
| dc.source.beginpage | 153 | |
| dc.source.conference | Silicon Nitride and Silicon Dioxide Thin Insulator Films | |
| dc.source.conferencedate | 27/04/2003 | |
| dc.source.conferencelocation | Paris France | |
| dc.source.endpage | 172 | |
| dc.title | What can low-frequency noise teach us about the quality of thin-gate dielectrics? | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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