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Analytical model for dispersion measurement in integrated waveguides using michelson interferometry effects

Date

2024
Proceedings Paper
https://doi.org/10.1051/epjconf/202430903006
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dc.contributor.authorYorkel, Isaac
dc.contributor.authorGirouard, Peter David
dc.contributor.authorGalili, Michael
dc.contributor.imecauthorGirouard, Peter David
dc.contributor.imecauthorGalili, Michael
dc.date.accessioned2025-02-24T17:58:33Z
dc.date.available2025-02-24T17:58:33Z
dc.date.issued2024
dc.identifier.doi10.1051/epjconf/202430903006
dc.identifier.isbn*****************
dc.identifier.issn2100-014X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45252
dc.publisherE D P SCIENCES
dc.source.beginpage03006
dc.source.conferenceEOS Annual Meeting (EOSAM)
dc.source.conferencedate2024-09-09
dc.source.conferencelocationNaples
dc.source.journalEPJ Web of Conferences
dc.source.numberofpages2
dc.subject.keywordsGROUP DELAY
dc.title

Analytical model for dispersion measurement in integrated waveguides using michelson interferometry effects

dc.typeProceedings paper
dspace.entity.typePublication
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