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Critical issues in the integration of Copper and low-k dielectrics
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Critical issues in the integration of Copper and low-k dielectrics
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Date
1999
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Donaton, R. A.
;
Coenegrachts, Bart
;
Maex, Karen
;
Struyf, Herbert
;
Vanhaelemeersch, Serge
;
Beyer, Gerald
;
Richard, Emmanuel
;
Vervoort, Iwan
;
Fyen, Wim
;
Grillaert, Joost
;
van der Groen, Sonja
;
Stucchi, Michele
;
De Roest, David
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1996
since deposited on 2021-10-06
Acq. date: 2026-01-11
Citations
Metrics
Views
1996
since deposited on 2021-10-06
Acq. date: 2026-01-11
Citations